IC Characterization and Functional Evaluation Test System


In recent years the number of smart devices we use has increased significantly. The role of the analog / sensor IC has become critically important not only in the smart society but also in other fields. More than ever, higher performance, tighter accuracy and longer reliability are required for those devices. To address these challenges measurement systems need to have many features while maintaining a very low test cost and engineers tasked with developing test programs require very good coding skills plus in-depth operation knowledge of the test system.



The new highly integrated measurement system “EVA100″ is supporting Power Supplies, SMU( 4 quadrant DC Signal Measurement Units ), Pattern Generators, Arbitrary Waveform Generators, Digitizers and Oscilloscopes necessary for complete analog / mixed-signal device evaluation and measurement.This new measurement system allows engineers quickly to build their own measurement environment without combining several standalone instruments.

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